| Scientific and Electronic papers |
| From NASA, NIST, IEEE etc. |
|
Metrology for the Electrical Characterization of Semiconductor Nanowires |
A Flexible Solution-Processed Memristor |
| The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs. | Insights into the characterization of polymer-based organic thin-film transistors using capacitance-voltage analysis |
| Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits | Controlled formation and resistivity scaling of nickel silicide nanolines |
|
Negative-bias temperature instability induced electron trapping
|
Semiconducting iron disilicide −FeSi2 is uniqueamong the transition metal |
| Electromagnetic Propagation and Reception #2 | Antenna Engineering Basics |
|
Electromagnetic Propagation and Reception #3 |
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Picture Password: A Visual Login Technique for Mobile Devices
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The Integration of Molecular Electronic Devices withTraditional CMOS Technologies |